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NI-VISN-100 RFID Tester
 

The NI-VISN-100 RFID Tester is a conformance test and measurement solution for the RFID devices. It is the first instrument in the world which has the build-in RFID protocol stack and the capability of real-time communication. The tester is based on National Instruments vector RF modules, including the 2.7GHz Upconverter, the 2.7 GHz Downconverter, the 3 GHz RF Preamplifier and the FPGA-Based RF Transceiver. With the capability of real-time vector RF signal generation and analysis, the tester is capable to generate and analyse the RFID signal according to all the RFID standards.

High Performance Hardware Platform   Suitable for RFID Test Items   Support International RFID Standards  
  • 250 kHz to 2.7 GHz Frequency range
  • 20 MHz Real-time bandwidth
  • -130 dBm/Hz Noise density
  • High-stability OCXO timebase
  • 100 MS/s, 14 bits IF Input
  • 200 MS/s, 14 bits IF Output
  • 3M Gates Xilinx Virtex-II Pro FPGA

 

  • Frequency Accuracy, Frequency Drift
  • Power in Band, OBW, ACPR
  • Frequency and Power Sweeping
  • Power On/Off Time, Settling Time
  • Transmission Ripple, Pulse Width, Duty Cycle, Modulation Depth
  • Tariˇ˘Delimiterˇ˘Preamble
  • Link Timing, Turn-around Time
  • Data Rate, Coding Test
  • AnticollisionTest, Protocol State Transition
  • ISO 14443 Type A&B
  • ISO 15693
  • ISO 18000-3 Mode 1&2
  • ISO 18000-6 Type A&B&C
  • EPC HF Class 1
  • EPC Class 1 Generation 2
  • Customized Standard
  • Future RFID Standard

 

 

> Data Sheet   NI-VISN-100 RFID Tester Specification
 
 
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